"A full characterization of single pitch IO ESD protection based on silicon ..."

J. Bourgeat et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.078

access: closed

type: Journal Article

metadata version: 2020-02-22

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J. Bourgeat, Philippe Galy, A. Dray, Jean Jimenez, D. Marin-Cudraz, Blaise Jacquier:
A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node. Microelectron. Reliab. 51(9-11): 1614-1617 (2011)

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