"Automatic process for time-frequency scan of VLSI."

Anthony Boscaro et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.052

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type: Journal Article

metadata version: 2022-06-23

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Anthony Boscaro, Sabir Jacquir, Kevin Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic process for time-frequency scan of VLSI. Microelectron. Reliab. 64: 299-305 (2016)

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