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"Assessing the risk of "Kirkendall voiding" in Cu₃Sn."

Peter Borgesen, Liang Yin, Pericles Kondos (2011)

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DOI: 10.1016/J.MICROREL.2010.11.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Peter Borgesen, Liang Yin, Pericles Kondos:
Assessing the risk of "Kirkendall voiding" in Cu₃Sn. Microelectron. Reliab. 51(4): 837-846 (2011)

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