"Reliability methods and standards."

Jaap Bisschop (2007)

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DOI: 10.1016/J.MICROREL.2007.07.084

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type: Journal Article

metadata version: 2020-02-22

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Jaap Bisschop:
Reliability methods and standards. Microelectron. Reliab. 47(9-11): 1330-1335 (2007)

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