"MIM capacitance variation under electrical stress."

C. Besset et al. (2003)

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DOI: 10.1016/S0026-2714(03)00177-X

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type: Journal Article

metadata version: 2020-02-22

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C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent:
MIM capacitance variation under electrical stress. Microelectron. Reliab. 43(8): 1237-1240 (2003)

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