"Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs ..."

Fanny Berthet et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.07.007

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type: Journal Article

metadata version: 2022-02-04

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Fanny Berthet, Yannick Guhel, Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, Marc Piccione, Christophe Gaquière:
Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence. Microelectron. Reliab. 52(9-10): 2159-2163 (2012)

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