"Reliability prediction with MTOL."

Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender (2017)

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DOI: 10.1016/J.MICROREL.2016.09.005

access: closed

type: Journal Article

metadata version: 2023-09-30

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Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender:
Reliability prediction with MTOL. Microelectron. Reliab. 68: 91-97 (2017)

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