"Estimation of SiC JFET temperature during short-circuit operations."

Mounira Berkani et al. (2009)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2009.06.024

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/BerkaniLBKFFH09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/BerkaniLBKFFH09
Mounira Berkani, Stéphane Lefebvre, Narjes Boughrara, Zoubir Khatir, Jean-Claude Faugières, Peter Friedrichs, Ali Haddouche:
Estimation of SiC JFET temperature during short-circuit operations. Microelectron. Reliab. 49(9-11): 1358-1362 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.