"Modelling and experimental verification of the impact of negative bias ..."

Néstor Berbel, Raúl Fernández-García, Ignacio Gil (2009)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2009.06.027

access: closed

type: Journal Article

metadata version: 2022-11-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/BerbelFG09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/BerbelFG09
Néstor Berbel, Raúl Fernández-García, Ignacio Gil:
Modelling and experimental verification of the impact of negative bias temperature instability on CMOS inverter. Microelectron. Reliab. 49(9-11): 1048-1051 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.