"Trench IGBT failure mechanisms evolution with temperature and gate ..."

Adel Benmansour et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.049

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type: Journal Article

metadata version: 2022-08-03

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Adel Benmansour, Stephane Azzopardi, Jean-Christophe Martin, Eric Woirgard:
Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions. Microelectron. Reliab. 47(9-11): 1730-1734 (2007)

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