"Impact of interface state trap density on the performance characteristics ..."

Brahim Benbakhti et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.11.017

access: closed

type: Journal Article

metadata version: 2020-11-06

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Brahim Benbakhti, J. S. Ayubi-Moak, Karol Kalna, D. Lin, Geert Hellings, Guy Brammertz, Kristin De Meyer, Iain Thayne, Asen Asenov:
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. Microelectron. Reliab. 50(3): 360-364 (2010)

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