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"Comparative analysis of accelerated ageing effects on power RF LDMOS ..."
Mohamed Ali Belaïd et al. (2005)
- Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon:
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability. Microelectron. Reliab. 45(9-11): 1732-1737 (2005)
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