"Backside Defect Localizations and Revelations Techniques on Gallium ..."

Felix Beaudoin et al. (2002)

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DOI: 10.1016/S0026-2714(02)00194-4

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type: Journal Article

metadata version: 2020-02-22

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Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement:
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42(9-11): 1581-1585 (2002)

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