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"New technique for the measurement of the static and of the transient ..."
Davide Barlini et al. (2006)
- Davide Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner:
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectron. Reliab. 46(9-11): 1772-1777 (2006)
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