"Functional delay test generation based on software prototype."

Eduardas Bareisa et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.050

access: closed

type: Journal Article

metadata version: 2023-03-21

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Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas:
Functional delay test generation based on software prototype. Microelectron. Reliab. 49(12): 1578-1585 (2009)

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