"Ageing mechanisms in Deep Trench Termination (DT²) Diode."

F. Baccar et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.132

access: closed

type: Journal Article

metadata version: 2024-10-06

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F. Baccar, Houssam Arbess, L. Théolier, Stephane Azzopardi, Eric Woirgard:
Ageing mechanisms in Deep Trench Termination (DT²) Diode. Microelectron. Reliab. 55(9-10): 1981-1987 (2015)

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