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"Assessment of the Trench IGBT reliability: low temperature experimental ..."
Stephane Azzopardi et al. (2005)
- Stephane Azzopardi, A. Benmansour, M. Ishiko, Eric Woirgard:
Assessment of the Trench IGBT reliability: low temperature experimental characterization. Microelectron. Reliab. 45(9-11): 1700-1705 (2005)
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