"Special section reliability and variability of devices for circuits and ..."

Asen Asenov et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.03.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou:
Special section reliability and variability of devices for circuits and systems. Microelectron. Reliab. 54(6-7): 1057 (2014)

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