"Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors ..."

N. Arpatzanis et al. (2008)

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DOI: 10.1016/J.MICROREL.2007.11.003

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type: Journal Article

metadata version: 2024-10-06

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N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos:
Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. Microelectron. Reliab. 48(4): 531-536 (2008)

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