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"Statistical aspects of the degradation of LDD nMOSFETs."
E. Andries et al. (2002)
- E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken
, K. F. Lo, Marc D'Olieslaeger
, Jan D'Haen:
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42(9-11): 1409-1413 (2002)
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