"Compact model for single event transients and total dose effects at high ..."

Joaquín Alvarado et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.040

access: closed

type: Journal Article

metadata version: 2021-10-14

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Joaquín Alvarado, El Hafed Boufouss, Valeria Kilchytska, Denis Flandre:
Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. Microelectron. Reliab. 50(9-11): 1852-1856 (2010)

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