"An affordable experimental technique for SRAM write margin ..."

Bartomeu Alorda et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.154

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type: Journal Article

metadata version: 2022-10-02

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Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota:
An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies. Microelectron. Reliab. 65: 280-288 (2016)

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