"Reliability of thin films: Experimental study on mechanical and thermal ..."

Atif Alkhazaili et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.01.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Atif Alkhazaili, Mohammad M. Hamasha, Gihoon Choi, Susan Lu, Charles R. Westgate:
Reliability of thin films: Experimental study on mechanical and thermal behavior of indium tin oxide and poly(3, 4-ethylenedioxythiophene). Microelectron. Reliab. 55(3-4): 538-546 (2015)

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