"GaN HEMT reliability."

Jesús A. del Alamo, Jungwoo Joh (2009)

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DOI: 10.1016/J.MICROREL.2009.07.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jesús A. del Alamo, Jungwoo Joh:
GaN HEMT reliability. Microelectron. Reliab. 49(9-11): 1200-1206 (2009)

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