"Electrical characteristics of MOSFETs with ..."

Parhat Ahmet et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.09.004

access: closed

type: Journal Article

metadata version: 2021-10-14

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Parhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai:
Electrical characteristics of MOSFETs with La₂O₃/Y₂O₃ gate stack. Microelectron. Reliab. 48(11-12): 1769-1771 (2008)

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