"A closed-loop IGBT non-destructive tester."

Ashraf Ahmed et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.108

access: closed

type: Journal Article

metadata version: 2022-02-04

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Ashraf Ahmed, Yasaman Shadrokh, Lee Coulbeck, Alberto Castellazzi, C. Mark Johnson:
A closed-loop IGBT non-destructive tester. Microelectron. Reliab. 52(9-10): 2358-2362 (2012)

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