"PMOS NBTI-induced circuit mismatch in advanced technologies."

Marty Agostinelli et al. (2006)

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DOI: 10.1016/J.MICROREL.2005.05.004

access: closed

type: Journal Article

metadata version: 2021-09-23

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Marty Agostinelli, Shing Lau, Sangwoo Pae, Phil Marzolf, Harish Muthali, Steve Jacobs:
PMOS NBTI-induced circuit mismatch in advanced technologies. Microelectron. Reliab. 46(1): 63-68 (2006)

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