"A journey towards reliability improvement of TiO2 based ..."

Debanjan Acharyya, Arnab Hazra, Partha Bhattacharyya (2014)

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DOI: 10.1016/J.MICROREL.2013.11.013

access: closed

type: Journal Article

metadata version: 2022-05-03

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Debanjan Acharyya, Arnab Hazra, Partha Bhattacharyya:
A journey towards reliability improvement of TiO₂ based Resistive Random Access Memory: A review. Microelectron. Reliab. 54(3): 541-560 (2014)

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