"Trustworthy Scan Design and Testability Using Obfuscation and Logic ..."

M. I. Shiny, M. Nirmala Devi (2022)

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DOI: 10.1007/S11036-021-01857-8

access: closed

type: Journal Article

metadata version: 2023-06-28

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M. I. Shiny, M. Nirmala Devi:
Trustworthy Scan Design and Testability Using Obfuscation and Logic Locking Scheme for Wireless Network Application. Mob. Networks Appl. 27(3): 1000-1018 (2022)

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