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"Asymptotic Characterization of Localized Defect Modes: ..."
Richard V. Craster, Bryn Davies (2023)
- Richard V. Craster, Bryn Davies:
Asymptotic Characterization of Localized Defect Modes: Su-Schrieffer-Heeger and Related Models. Multiscale Model. Simul. 21(3): 827-848 (2023)
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