"Suppressed current collapse and improved threshold voltage stability of ..."

Yitai Zhu et al. (2024)

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DOI: 10.1016/J.MEJO.2024.106191

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type: Journal Article

metadata version: 2024-10-06

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Yitai Zhu, Yu Zhang, Haolan Qu, Han Gao, Haitao Du, Haowen Guo, Xinbo Zou:
Suppressed current collapse and improved threshold voltage stability of AlGaN/GaN HEMT via O2 plasma treatment. Microelectron. J. 148: 106191 (2024)

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