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ORCID"Investigation on dependency of thermal characteristics on gate/drain bias ..."
Peng Zhao et al. (2023)
- Peng Zhao
, Lei Cao, Fan Zhang, Haoqing Xu, Weizhuo Gan, Qingzhu Zhang, Zhaohao Zhang, Jiaxin Yao, Guoliang Tian, Kun Luo, Zhenhua Wu, Huaxiang Yin:
Investigation on dependency of thermal characteristics on gate/drain bias voltages in stacked nanosheet transistors. Microelectron. J. 141: 105970 (2023)
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