"Investigation and optimization of electro-thermal performance of Double ..."

Xuguo Zhang et al. (2022)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2022.105540

access: closed

type: Journal Article

metadata version: 2022-11-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/ZhangXCWLLBT22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/ZhangXCWLLBT22
Xuguo Zhang, Jie Xu, Zixin Chen, Qiuhui Wang, Weijing Liu, Qinghua Li, Wei Bai, Xiadong Tang:
Investigation and optimization of electro-thermal performance of Double Gate-All-Around MOSFET. Microelectron. J. 129: 105540 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.