"Impacts of gate-oxide breakdown on power-gated SRAM."

Hao-I Yang, Wei Hwang, Ching-Te Chuang (2011)

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DOI: 10.1016/J.MEJO.2010.08.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hao-I Yang, Wei Hwang, Ching-Te Chuang:
Impacts of gate-oxide breakdown on power-gated SRAM. Microelectron. J. 42(1): 101-112 (2011)

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