"A cost-effective and highly robust triple-node-upset self-recoverable ..."

Hui Xu et al. (2024)

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DOI: 10.1016/J.MEJO.2024.106422

access: closed

type: Journal Article

metadata version: 2024-10-22

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Hui Xu, Lin Tang, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Jiuqi Li, Xiaodong Ai:
A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements. Microelectron. J. 153: 106422 (2024)

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