"Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures."

M. I. N. da Silva, J. C. González, P. E. Russell (2003)

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DOI: 10.1016/S0026-2692(03)00051-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. I. N. da Silva, J. C. González, P. E. Russell:
Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures. Microelectron. J. 34(5-8): 571-573 (2003)

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