"Investigation of dynamic ron stability and hot electrons ..."

Jingyu Shen, Liang Jing, Jinpeng Qiu (2023)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2023.106023

access: closed

type: Journal Article

metadata version: 2024-01-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/ShenJQ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/ShenJQ23
Jingyu Shen, Liang Jing, Jinpeng Qiu:
Investigation of dynamic r_on stability and hot electrons reliability in normally-off AlGaN/GaN power HEMTs. Microelectron. J. 142: 106023 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.