"Thermal transient characterization of semiconductor devices with multiple ..."

Dirk Schweitzer et al. (2015)

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DOI: 10.1016/J.MEJO.2014.11.001

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type: Journal Article

metadata version: 2024-10-06

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Dirk Schweitzer, Ferenc Ender, Gusztáv Hantos, Péter G. Szabó:
Thermal transient characterization of semiconductor devices with multiple heat sources - Fundamentals for a new thermal standard. Microelectron. J. 46(2): 174-182 (2015)

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