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"Thermal characterization of embedded electronic features by an integrated ..."

Peter E. Raad, Pavel L. Komarov, Mihai G. Burzo (2008)

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DOI: 10.1016/J.MEJO.2007.11.006

access: closed

type: Journal Article

metadata version: 2020-10-26

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Peter E. Raad, Pavel L. Komarov, Mihai G. Burzo:
Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling. Microelectron. J. 39(7): 1008-1015 (2008)

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