"Quick and cost-efficient A/D converter static characterization using ..."

Wei Wei Qin et al. (2018)

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DOI: 10.1016/J.MEJO.2018.02.001

access: closed

type: Journal Article

metadata version: 2020-12-29

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Wei Wei Qin, Sai-Weng Sin, Seng-Pan U, Rui Paulo Martins:
Quick and cost-efficient A/D converter static characterization using low-precision testing signal. Microelectron. J. 74: 86-93 (2018)

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