"Threshold voltage degradation under high Vgs and low Vds on 200 V SOI ..."

Qinsong Qian et al. (2011)

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DOI: 10.1016/J.MEJO.2011.03.011

access: closed

type: Journal Article

metadata version: 2023-06-27

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Qinsong Qian, Siyang Liu, Weifeng Sun, Hu Sun:
Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices. Microelectron. J. 42(5): 609-613 (2011)

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