"A new method for temperature field characterization of microsystems based ..."

Yanrong Pei et al. (2024)

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DOI: 10.1016/J.MEJO.2024.106464

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type: Journal Article

metadata version: 2024-11-30

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Yanrong Pei, Wenchang Li, Jian Liu, Tianyi Zhang:
A new method for temperature field characterization of microsystems based on transient thermal simulation. Microelectron. J. 154: 106464 (2024)

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