"Short failure localization in advanced package using optoelectronic ..."

Longhai Liu et al. (2024)

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DOI: 10.1016/J.MEJO.2024.106310

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type: Journal Article

metadata version: 2024-08-22

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Longhai Liu, Kangrong Li, Qiao Yang, Yang Shang, Zhen Xu, Jining Li, Degang Xu, Jianquan Yao:
Short failure localization in advanced package using optoelectronic sampling terahertz time domain reflectometry and deconvolution method. Microelectron. J. 151: 106310 (2024)

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