"Reliability for nanomagnetic logic (NML) readout circuit under single ..."

Baojun Liu et al. (2015)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2014.09.014

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/LiuCLK15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/LiuCLK15
Baojun Liu, Li Cai, Yan Li, Qiang Kang:
Reliability for nanomagnetic logic (NML) readout circuit under single event effect. Microelectron. J. 46(1): 20-26 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.