"Machine learning based prediction model for single event burnout hardening ..."

Xinfang Liao et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105893

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type: Journal Article

metadata version: 2023-09-24

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Xinfang Liao, Changqing Xu, Yi Liu, Chen Wang, Dongdong Chen, Yintang Yang:
Machine learning based prediction model for single event burnout hardening design of power MOSFETs. Microelectron. J. 139: 105893 (2023)

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