"Simulation of electronic/ionic mixed conduction in solid ionic memory devices."

Hyuck In Kwon, Umberto Ravaioli (2006)

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DOI: 10.1016/J.MEJO.2006.04.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hyuck In Kwon, Umberto Ravaioli:
Simulation of electronic/ionic mixed conduction in solid ionic memory devices. Microelectron. J. 37(10): 1047-1051 (2006)

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