"Impact of temperature and interface trapped charges variation on the ..."

Pallavi Kumari et al. (2021)

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DOI: 10.1016/J.MEJO.2021.105077

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type: Journal Article

metadata version: 2021-10-14

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Pallavi Kumari, Anand Raj, Kumari Nibha Priyadarshani, Sangeeta Singh:
Impact of temperature and interface trapped charges variation on the Analog/RF and linearity of vertically extended drain double gate Si_0.5Ge_0.5 source tunnel FET. Microelectron. J. 113: 105077 (2021)

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