"Dynamic reliability management based on resource-based EM modeling for ..."

Taeyoung Kim, Zao Liu, Sheldon X.-D. Tan (2018)

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DOI: 10.1016/J.MEJO.2018.01.024

access: closed

type: Journal Article

metadata version: 2020-02-22

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Taeyoung Kim, Zao Liu, Sheldon X.-D. Tan:
Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors. Microelectron. J. 74: 106-115 (2018)

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