![](https://dblp.uni-trier.de./img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de./img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de./img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
default search action
"How well can we assess thermally driven reliability issues in electronic ..."
Yogendra Joshi et al. (2003)
- Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala:
How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectron. J. 34(12): 1195-1201 (2003)
![](https://dblp.uni-trier.de./img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.