"How well can we assess thermally driven reliability issues in electronic ..."

Yogendra Joshi et al. (2003)

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DOI: 10.1016/S0026-2692(03)00200-3

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type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/JoshiABLMR03
Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala:
How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectron. J. 34(12): 1195-1201 (2003)

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