"Device preparation and characterization of drain current transients in ..."

C. M. Joseph et al. (2006)

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DOI: 10.1016/J.MEJO.2006.03.002

access: closed

type: Journal Article

metadata version: 2024-10-06

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C. M. Joseph, T. Natsume, Masakazu Nakamura, Masaaki Iizuka, Kazuhiro Kudo:
Device preparation and characterization of drain current transients in static induction micro transistors. Microelectron. J. 37(9): 884-887 (2006)

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